450 nm blue laser pseudo dataset
Based on original measurements.For testing and benchmarking under simulated conditions only.
This pseudo dataset contains 18 generated degradation trajectories for 450 nm blue laser diodes, sampled every 0.5 h. Power and voltage trends are constrained by original measurements. Device-specific aging-current changes after 1500 h are retained, with smooth changes in degradation rate while the recorded aging temperature stays constant.
Attribution: Chizhi Chris Zhang; Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences; China Electronic Product Reliability and Environmental Testing Research Institute (CEPREI; the Fifth Electronics Research Institute of MIIT), Guangzhou
IEEE citation
[1] C. C. Zhang, X. Feng, and J. Jiang, “Segmental Viterbi estimation using transition constraints for covariate-dependent hidden semi-Markov degradation models with right censoring,” Reliab. Eng. Syst. Saf., vol. 278, Art. no. 113615, Feb. 2027, doi: 10.1016/j.ress.2026.113615.
Files & variables
Files
One CSV per device, with cumulative aging time. Each trajectory ends at the device’s last original measurement time (700–2700 h). Apply a chosen failure threshold and treat non-crossing records as right-censored.
Variables
| Field | Description |
|---|---|
| time_h | Cumulative aging time (h) |
| current_mA | Characterization current (mA), fixed at 600 mA |
| voltage_V | Simulated device voltage at the characterization current (V) |
| power_mW | Simulated optical power at the characterization current (mW) |
| aging_current_mA | Aging current (mA), including recorded changes after 1500 h where applicable |
| aging_temperature_C | Recorded aging temperature (°C), constant within each device |
SHA-256 184889883e735b5b2ef41bbde172b5ded74d1195f10934030162e4a443c8b500